Article 4CYKF Rohde & Schwarz Presents: Smart Jammer / DRFM Testing – Test and Measurement Solutions for the Next Level

Rohde & Schwarz Presents: Smart Jammer / DRFM Testing – Test and Measurement Solutions for the Next Level

by
from IEEE Spectrum on (#4CYKF)
The webinar introduces the concept of Digital RF Memory Jammers, describes their technology and the respective test and measurement challenges and solutions from Rohde & Schwarz.CLoNNqfw4Zg
External Content
Source RSS or Atom Feed
Feed Location http://feeds.feedburner.com/IeeeSpectrum
Feed Title IEEE Spectrum
Feed Link https://spectrum.ieee.org/
Reply 0 comments