Advanced low-frequency noise measurement system: 9812DX
by from IEEE Spectrum on (#4QNPT)
The 9812DX system, consisting of three current amplifiers and one voltage amplifier, fully demonstrates its superior capabilities and versatility measuring low-frequency noise characteristics of onwafer transistors over a wide range of bias voltage 200V, bias current 200mA and operating frequency bandwidth 0.03Hz - 10 MHz down to an extremely low noise resolution of 1e-27 A2/Hz.