Article 5WNRC Intel "In-Field Scan" Coming With Sapphire Rapids As New Silicon Failure Testing Feature

Intel "In-Field Scan" Coming With Sapphire Rapids As New Silicon Failure Testing Feature

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from Phoronix on (#5WNRC)
Intel In-Field Scan is a hardware feature we have not heard the company talk about publicly until yesterday when they posted a new open-source Linux driver for this hardware failure testing feature being introduced with Sapphire Rapids processors...
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