Choosing an Optical Measurement Sensor for Non-contact Displacement, Dimension and Thickness Measurement

Optical sensors are increasingly used for precision measurement due to many factors. On one hand, displacement, thickness and dimensions must be measured much more accurately with micrometer resolution, and on the other hand sensors must measure against fragile surfaces that cannot be touched.

Their rapid growth in the sensor market has pushed the development of new technologies to meet demanding requirements and to improve measurement accuracy. It is therefore more important than ever to have a greater level of understanding of the strengths and limitations of each optical measurement principle when selecting the correct sensor technology for your specific measurement task. The key is selecting the most appropriate sensing technology for your measurement task.

This webinar explains different technologies, restrictions and differences of the following technologies: confocal chromatic sensors, laser triangulation sensors (and time-of-flight sensors) and laser profile sensors, including the innovative blue laser technology. All these sensors are used for measurements with high precision, stability and high measuring rates.

Attendees will learn the operating principles of optical measuring sensors for displacement, position, thickness, gap, profile and 2D/3D dimension with just one sensor. Various animations and graphics show detailed application examples and give important tips for choosing the right technology. Additional resources for further details are provided by Micro-Epsilon

PRESENTERS:

Martin Dumberger, Managing Director, Micro-Epsilon America

Martin Dumberger has more than 25 years of experience in high precision measurement and sensors.

His focus has been on non-contact measuring technologies such as eddy current, capacitive and optical sensors.

With a background in engineering and 10 years of R&D exposure in this field, Martin has been educating and supporting customers in all industries to solve challenging measurement applications.

Martin Dumberger is co-founder of Micro-Epsilon America and Managing Director of Micro-Epsilon America.

Attendees of this IEEE Spectrum webinar have the opportunity to earn PDHs or Continuing Education Certificates! To request your certificate you will need to get a code. Once you have registered and viewed the webinar send a request to gs-webinarteam@ieeeglobalspec.com for a webinar code. To request your certificate complete the form here: http://innovationatwork.ieee.org/spectrum/

Attendance is free. To access the event please register. NOTE: By registering for this webinar you understand and agree that IEEE Spectrum will share your contact information with the sponsors of this webinar and that both IEEE Spectrum and the sponsors may send email communications to you in the future."